Hot Carrier Effects in Wireless Communication Systems Built on Short-Channel MOSFETs

Phase noise is a critical factor that degrades the synchronization performance of a wireless communication receiver. Hot-carriers (HCs), found in the CMOS synchronization devices, are high-energy charge-carriers that can degrade the MOSFETs performance by damaging the internal device structure and lead to the phase noise increase therein. Such incremental phase noise can be related to the essential parameter, namely the MOSFET threshold voltage due to the HC effect, which is particularly evident in the short-channel MOSFET devices. In this letter, we analyze the impact of the phase noise arising from the HC effect on the wireless systems in terms of the bit-error-rate (BER) and the signal-to-interference-plus-noise ratio (SINR).