Title :
IVa-7 the effects of charge injection on gated-diode breakdown
Author :
Amantea, R. ; Muller, R.S.
fDate :
9/1/1977 12:00:00 AM
Keywords :
Breakdown voltage; Electric breakdown; Hot carriers; Impact ionization; Impurities; Insulation; Laboratories; Semiconductor diodes; Split gate flash memory cells; Substrates;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1977.18954
