IVa-6 studies of Si/SiO2interfaces by Auger sputter profiling and photoelectron spectroscopy using synchrotron radiation
Author :
Garner, C.M. ; Miller, Jason ; Lindau, I. ; Schwarz, Stefan ; Spicer, W.E.
Volume :
24
Issue :
9
fYear :
1977
fDate :
9/1/1977 12:00:00 AM
Firstpage :
1208
Lastpage :
1208
Keywords :
Application specific processors; Breakdown voltage; Chemical technology; Contracts; Diodes; Electric breakdown; Insulation; Laboratories; Silicon; Spectroscopy;
