Title :
VI-5 accelerated aging of (Al,Ga)As double heterostructure lasers
Author :
Hartman, R.L. ; Schumaker, N.E. ; Dixon, R.W.
fDate :
9/1/1977 12:00:00 AM
Keywords :
Accelerated aging; Degradation; Laboratories; Laser modes; Optical devices; Power lasers; Silicon; Temperature; Testing; Threshold voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1977.18976
