• DocumentCode
    1058709
  • Title

    Quasioptical Sapphire Resonators in the Form of a Truncated Cone

  • Author

    Barannik, Alexander A. ; Bunyaev, Sergey A. ; Cherpak, Nickolay T. ; Vitusevich, Svetlana A.

  • Author_Institution
    A. Usikov Inst. of Radiophys. & Electron., Nat. Acad. of Sci. of Ukraine, Kharkov
  • Volume
    26
  • Issue
    17
  • fYear
    2008
  • Firstpage
    3118
  • Lastpage
    3123
  • Abstract
    This paper reports on a detailed experimental study of quasioptical dielectric resonators (QDRs) designed in the form of a truncated cone and excited on whispering-gallery modes. One aim of this paper is to study of the eigenfrequency spectrum and quality factors of single-crystal sapphire resonators. A second aim is to show the applicability of the resonator technique not only in optical but also in the millimeter-wave range, in particular, for studying the surface resistance (Rs) of high-temperature superconducting films. The measured frequencies of QDR as a function of the wedge angle of the cone resonator are in a good agreement with those frequencies simulated using the CST Microwave Studio 2006 program. Additionally, electrodynamic characteristics of the cone resonator and hemispherical dielectric resonator with conducting endplate are compared.
  • Keywords
    Q-factor; dielectric resonators; sapphire; whispering gallery modes; cone resonator; dielectric resonators; eigenfrequency spectrum; electrodynamic characteristics; high temperature superconducting films; quality factors; quasioptical sapphire resonators; surface resistance; truncated cone; whispering gallery modes; Dielectrics; Frequency; Millimeter wave measurements; Millimeter wave technology; Optical films; Optical resonators; Q factor; Superconducting films; Surface resistance; Whispering gallery modes; Dielectric resonators; Q factor; millimeter-wave measurements; quasioptical resonators; superconducting films;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2008.925039
  • Filename
    4738474