• DocumentCode
    1058721
  • Title

    Interlaboratory Comparisons of NbTi Critical Current Measurements

  • Author

    Godeke, Arno ; Turrioni, Daniele ; Boutboul, Thierry ; Cheggour, Najib ; Ghosh, Arup K. ; Goodrich, Loren F. ; Meinesz, Maarten ; Den Ouden, Andries

  • Author_Institution
    Lawrence Berkeley Nat. Lab., Berkeley, CA, USA
  • Volume
    19
  • Issue
    3
  • fYear
    2009
  • fDate
    6/1/2009 12:00:00 AM
  • Firstpage
    2633
  • Lastpage
    2636
  • Abstract
    We report on a multi-institute comparison of critical current data measured on a modern NbTi wire for the Large Hadron Collider (LHC), which has shown a standard deviation below 1% in critical current density spread in more than 1500 measurements. Interlaboratory comparisons on Nb3Sn wires have shown ambiguities that could be attributable to strain related differences in critical current density, originating from differences in sample handling, reaction, and mounting techniques, or also to differences in the magnetic field and current calibrations between the institutes. A round robin test of a well characterized NbTi wire provides a baseline variance in critical current results that is presumed to be attributable only to differences in the characterization systems. Systematic differences on the order of 3.5% are found in the comparison. The most likely cause for the observed differences is a small diameter holder that brings the wire into a strain regime in which strain effects can no longer be ignored. A NbTi round robin test, when performed properly, will separate system differences from sample specific differences and provide laboratories with an opportunity to calibrate equipment against a standard measurement.
  • Keywords
    critical current density (superconductivity); magnetic fields; niobium alloys; superconducting particle detectors; tin alloys; titanium alloys; LHC; Large Hadron Collider; Nb3Sn; NbTi; chemical reaction; critical current density; critical current measurements; current calibrations; magnetic field; mounting techniques; round robin test; sample handling; standard measurement; superconducting wires; Critical current; NbTi; round robin; standardization;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2009.2019096
  • Filename
    5067027