DocumentCode
1058721
Title
Interlaboratory Comparisons of NbTi Critical Current Measurements
Author
Godeke, Arno ; Turrioni, Daniele ; Boutboul, Thierry ; Cheggour, Najib ; Ghosh, Arup K. ; Goodrich, Loren F. ; Meinesz, Maarten ; Den Ouden, Andries
Author_Institution
Lawrence Berkeley Nat. Lab., Berkeley, CA, USA
Volume
19
Issue
3
fYear
2009
fDate
6/1/2009 12:00:00 AM
Firstpage
2633
Lastpage
2636
Abstract
We report on a multi-institute comparison of critical current data measured on a modern NbTi wire for the Large Hadron Collider (LHC), which has shown a standard deviation below 1% in critical current density spread in more than 1500 measurements. Interlaboratory comparisons on Nb3Sn wires have shown ambiguities that could be attributable to strain related differences in critical current density, originating from differences in sample handling, reaction, and mounting techniques, or also to differences in the magnetic field and current calibrations between the institutes. A round robin test of a well characterized NbTi wire provides a baseline variance in critical current results that is presumed to be attributable only to differences in the characterization systems. Systematic differences on the order of 3.5% are found in the comparison. The most likely cause for the observed differences is a small diameter holder that brings the wire into a strain regime in which strain effects can no longer be ignored. A NbTi round robin test, when performed properly, will separate system differences from sample specific differences and provide laboratories with an opportunity to calibrate equipment against a standard measurement.
Keywords
critical current density (superconductivity); magnetic fields; niobium alloys; superconducting particle detectors; tin alloys; titanium alloys; LHC; Large Hadron Collider; Nb3Sn; NbTi; chemical reaction; critical current density; critical current measurements; current calibrations; magnetic field; mounting techniques; round robin test; sample handling; standard measurement; superconducting wires; Critical current; NbTi; round robin; standardization;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2009.2019096
Filename
5067027
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