• DocumentCode
    1058776
  • Title

    Parasitic Coupling Effects in Multimode Buried Channel Waveguides Arrays for O-PCB Interconnects

  • Author

    Donato, Andrea Di ; Farina, Marco ; Lucesoli, Agnese ; Maccari, Luca ; Mencarelli, Davide ; Angeloni, Giacomo ; Di Gregorio, Giordano M. ; Rozzi, Tullio

  • Author_Institution
    Dept. of Electromagn. & Bioeng., Polytech. Univ. of Marche, Ancona
  • Volume
    26
  • Issue
    17
  • fYear
    2008
  • Firstpage
    3124
  • Lastpage
    3130
  • Abstract
    The use of buried channel waveguides in optical printed circuits boards (O-PCB) offers the possibility of overcoming some problems and limitations encountered in high-frequency electrical interconnects. Although the use of optical waveguides reduces significantly crosstalk and electromagnetic interferences, parasitic coupling effects between the buried channels may appear when waveguide arrays are realized. In this paper, we analyze theoretically and experimentally the conditions inducing crosstalk effects in a multimode array, realized by means of a conventional photolithographic patterning technique. In particular, the results show how the common configuration used to pattern an array of optical waveguides produces a parasitic slab waveguide close to the core channels, accounting for a substantial increase of the coupling effects.
  • Keywords
    optical crosstalk; optical interconnections; optical waveguides; printed circuits; crosstalk effects; multimode buried channel waveguides arrays; optical printed circuits board interconnect; parasitic coupling effects; photolithographic patterning technique; Coupling circuits; Electromagnetic coupling; Electromagnetic waveguides; Integrated circuit interconnections; Optical arrays; Optical coupling; Optical crosstalk; Optical interconnections; Optical waveguide theory; Optical waveguides; Multimode polymeric waveguide; optical interconnections; optical printed circuits board (O-PCB);
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2008.925047
  • Filename
    4738481