DocumentCode :
1058820
Title :
Transient behavior of Gunn domains and associated equivalent circuits
Author :
Freeman, Jon C. ; Jethwa, Chunilal P.
Author_Institution :
Bell Laboratories, North Andover, MA
Volume :
24
Issue :
12
fYear :
1977
fDate :
12/1/1977 12:00:00 AM
Firstpage :
1346
Lastpage :
1350
Abstract :
A new and more exact expression for the transient behavior of Gunn domains is found. General expressions for lumped-element values for an equivalent circuit are also presented. Some discrepancies between previously developed equivalent circuits are resolved. It is shown that the nonlinear equation describing the domain voltage may be put in the form of Abel´s equation. Limitations in the use of zero diffusion approximations in transient analysis is considered in detail.
Keywords :
Books; Equations; Equivalent circuits; Gunn devices; Helium; Physics; Semiconductor process modeling; Time factors; Transient response; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1977.19011
Filename :
1479203
Link To Document :
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