• DocumentCode
    1058854
  • Title

    Numerical Study on Optimization of Active Layer Structures for GaN/AlGaN Multiple-Quantum-Well Laser Diodes

  • Author

    Chen, Jun-Rong ; Ko, Tsung-Shine ; Su, Po-Yuan ; Lu, Tien-Chang ; Kuo, Hao-Chung ; Kuo, Yen-Kuang ; Wang, Shing-Chung

  • Author_Institution
    Dept. of Photonics & the Inst. of Electro-Opt. Eng., Nat. Chiao Tung Univ., Hsinchu
  • Volume
    26
  • Issue
    17
  • fYear
    2008
  • Firstpage
    3155
  • Lastpage
    3165
  • Abstract
    Theoretical analysis for different active layer structures is performed to minimize the laser threshold current of the ultraviolet GaN/AlGaN multiple-quantum-well laser diodes by using advanced device simulation. The simulation results show that the lower threshold current can be obtained when the number of quantum wells is two or three and the aluminum composition in the barrier layer is about 10%-12%. This result is attributed to several different effects including electron leakage current, nonuniform carrier distribution, interface charge density induced by spontaneous and piezoelectric polarization, and optical confinement factor. These internal physical mechanisms are investigated by theoretical calculation to analyze the effects of quantum-well number and different aluminum compositions in barrier layer on laser threshold properties. Furthermore, the effect of quantum-well thickness is discussed as well. It is found that the optimal quantum-well thickness is about 3 nm due to the balance of the advantages of a large confinement factor against the disadvantages of significant quantum-confined Stark effect (QCSE).
  • Keywords
    III-V semiconductors; Stark effect; aluminium compounds; carrier density; gallium compounds; leakage currents; quantum well lasers; wide band gap semiconductors; GaN-AlGaN; Stark effect; active layer structure optimization; barrier layer; electron leakage current; interface charge density; laser threshold current; laser threshold property; multiple quantum well laser diodes; nonuniform carrier distribution; optical confinement; piezoelectric polarization; quantum well thickness; quantum-well number; spontaneous polarization; ultraviolet laser; Aluminum gallium nitride; Analytical models; Diode lasers; Electrons; Gallium nitride; Laser theory; Performance analysis; Quantum well devices; Quantum well lasers; Threshold current; AlGaN; GaN; numerical simulation; semiconductor lasers; ultraviolet;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2008.926939
  • Filename
    4738488