DocumentCode
1058854
Title
Numerical Study on Optimization of Active Layer Structures for GaN/AlGaN Multiple-Quantum-Well Laser Diodes
Author
Chen, Jun-Rong ; Ko, Tsung-Shine ; Su, Po-Yuan ; Lu, Tien-Chang ; Kuo, Hao-Chung ; Kuo, Yen-Kuang ; Wang, Shing-Chung
Author_Institution
Dept. of Photonics & the Inst. of Electro-Opt. Eng., Nat. Chiao Tung Univ., Hsinchu
Volume
26
Issue
17
fYear
2008
Firstpage
3155
Lastpage
3165
Abstract
Theoretical analysis for different active layer structures is performed to minimize the laser threshold current of the ultraviolet GaN/AlGaN multiple-quantum-well laser diodes by using advanced device simulation. The simulation results show that the lower threshold current can be obtained when the number of quantum wells is two or three and the aluminum composition in the barrier layer is about 10%-12%. This result is attributed to several different effects including electron leakage current, nonuniform carrier distribution, interface charge density induced by spontaneous and piezoelectric polarization, and optical confinement factor. These internal physical mechanisms are investigated by theoretical calculation to analyze the effects of quantum-well number and different aluminum compositions in barrier layer on laser threshold properties. Furthermore, the effect of quantum-well thickness is discussed as well. It is found that the optimal quantum-well thickness is about 3 nm due to the balance of the advantages of a large confinement factor against the disadvantages of significant quantum-confined Stark effect (QCSE).
Keywords
III-V semiconductors; Stark effect; aluminium compounds; carrier density; gallium compounds; leakage currents; quantum well lasers; wide band gap semiconductors; GaN-AlGaN; Stark effect; active layer structure optimization; barrier layer; electron leakage current; interface charge density; laser threshold current; laser threshold property; multiple quantum well laser diodes; nonuniform carrier distribution; optical confinement; piezoelectric polarization; quantum well thickness; quantum-well number; spontaneous polarization; ultraviolet laser; Aluminum gallium nitride; Analytical models; Diode lasers; Electrons; Gallium nitride; Laser theory; Performance analysis; Quantum well devices; Quantum well lasers; Threshold current; AlGaN; GaN; numerical simulation; semiconductor lasers; ultraviolet;
fLanguage
English
Journal_Title
Lightwave Technology, Journal of
Publisher
ieee
ISSN
0733-8724
Type
jour
DOI
10.1109/JLT.2008.926939
Filename
4738488
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