Title :
Reliability of SSPA´s and TWTA´s
Author_Institution :
RAD Strauss Assoc., McLean, VA, USA
fDate :
4/1/1994 12:00:00 AM
Abstract :
Two extensive communication satellite reliability studies were conducted in 1991 and 1993. These studies permitted a direct `in-orbit´ comparison at C-band between a thermionic electron device [TWT/TWTA] and a solid state device [GaAs MESFET/SSPA]. Excellent performance, lifetimes and reliabilities for both types of microwave power amplifiers were obtained. However, surprisingly, both studies registered higher failure rates for SSPA´s than TWTA´s
Keywords :
electron tube testing; microwave amplifiers; power amplifiers; reliability; satellite relay systems; travelling-wave-tubes; C-band; GaAs; GaAs MESFET/SSPA; TWTA; communication satellite reliability; failure rates; in-orbit comparison; lifetimes; microwave power amplifiers; thermionic electron device; Artificial satellites; Cathodes; Electron devices; Gallium arsenide; Microwave amplifiers; Microwave devices; Payloads; Power amplifiers; Radiofrequency amplifiers; Solid state circuits;
Journal_Title :
Electron Devices, IEEE Transactions on
