DocumentCode :
1059009
Title :
High-level behavior of power rectifiers: A quantitative analysis of the forward voltage drop
Author :
Munoz-Yagüe, Antonio ; Leturcq, Philippe
Author_Institution :
Laboratoire d´´Automatique et d´´Analyse des Systèmes du C.N.R.S., Toulouse, France
Volume :
25
Issue :
1
fYear :
1978
fDate :
1/1/1978 12:00:00 AM
Firstpage :
42
Lastpage :
49
Abstract :
In forward biased power rectifiers, quasi-neutrality holds in all regions of the device. As a consequence, numerical analysis of the behavior of the devices can be carried out without involving the treatment of Poisson\´s equation. This allows fast and accurate computation of the forward J(V) characteristic. Taking into account the physical mechanisms appearing at high concentration levels of impurities and carriers, the numerical results obtained agree with the experimental ones. This is shown for a series of devices covering a wide range of technological parameters such as the width of the semiconductor layers, the conditions of gold diffusion, etc.
Keywords :
Charge carrier processes; Current density; Numerical analysis; Poisson equations; Radiative recombination; Rectifiers; Semiconductor impurities; Spontaneous emission; Thyristors; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1978.19029
Filename :
1479423
Link To Document :
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