• DocumentCode
    1059009
  • Title

    High-level behavior of power rectifiers: A quantitative analysis of the forward voltage drop

  • Author

    Munoz-Yagüe, Antonio ; Leturcq, Philippe

  • Author_Institution
    Laboratoire d´´Automatique et d´´Analyse des Systèmes du C.N.R.S., Toulouse, France
  • Volume
    25
  • Issue
    1
  • fYear
    1978
  • fDate
    1/1/1978 12:00:00 AM
  • Firstpage
    42
  • Lastpage
    49
  • Abstract
    In forward biased power rectifiers, quasi-neutrality holds in all regions of the device. As a consequence, numerical analysis of the behavior of the devices can be carried out without involving the treatment of Poisson\´s equation. This allows fast and accurate computation of the forward J(V) characteristic. Taking into account the physical mechanisms appearing at high concentration levels of impurities and carriers, the numerical results obtained agree with the experimental ones. This is shown for a series of devices covering a wide range of technological parameters such as the width of the semiconductor layers, the conditions of gold diffusion, etc.
  • Keywords
    Charge carrier processes; Current density; Numerical analysis; Poisson equations; Radiative recombination; Rectifiers; Semiconductor impurities; Spontaneous emission; Thyristors; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1978.19029
  • Filename
    1479423