DocumentCode
1059009
Title
High-level behavior of power rectifiers: A quantitative analysis of the forward voltage drop
Author
Munoz-Yagüe, Antonio ; Leturcq, Philippe
Author_Institution
Laboratoire d´´Automatique et d´´Analyse des Systèmes du C.N.R.S., Toulouse, France
Volume
25
Issue
1
fYear
1978
fDate
1/1/1978 12:00:00 AM
Firstpage
42
Lastpage
49
Abstract
In forward biased power rectifiers, quasi-neutrality holds in all regions of the device. As a consequence, numerical analysis of the behavior of the devices can be carried out without involving the treatment of Poisson\´s equation. This allows fast and accurate computation of the forward
characteristic. Taking into account the physical mechanisms appearing at high concentration levels of impurities and carriers, the numerical results obtained agree with the experimental ones. This is shown for a series of devices covering a wide range of technological parameters such as the width of the semiconductor layers, the conditions of gold diffusion, etc.
characteristic. Taking into account the physical mechanisms appearing at high concentration levels of impurities and carriers, the numerical results obtained agree with the experimental ones. This is shown for a series of devices covering a wide range of technological parameters such as the width of the semiconductor layers, the conditions of gold diffusion, etc.Keywords
Charge carrier processes; Current density; Numerical analysis; Poisson equations; Radiative recombination; Rectifiers; Semiconductor impurities; Spontaneous emission; Thyristors; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1978.19029
Filename
1479423
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