DocumentCode :
1059127
Title :
Precision radar cross-section measurements for computer code validation
Author :
Mishra, S.R. ; Larose, C.L. ; Trueman, C.W.
Author_Institution :
David Florida Lab., Canadian Space Agency, Ottawa, Ont., Canada
Volume :
42
Issue :
2
fYear :
1993
fDate :
4/1/1993 12:00:00 AM
Firstpage :
179
Lastpage :
185
Abstract :
Precision measurements of the radar cross section (RCS) of simple rod and cylinder targets for all angles of incidence in a plane containing the long axis of the target are presented. The RCS is presented as a contour map as a function of the frequency and the incidence angle. These extensive measured RCS data are used as a reference for validating numerical computations. Wire-grid models of the rod and cylinder targets are constructed using commonly accepted guidelines. It is shown that the resulting RCS is in error by less than 2 dBm2 for segments of length as long as λ/5, and that the wire grid is capable of precisely determining the resonant frequencies of the wire. A comparison of the RCS of the rod computed using the finite-difference time-domain method with the measured RCS suggests a cell-size correction. Thus, the surface of the conducting object is considered to be 1/4 cell away from the surface of cells designed as perfectly conducting. This quarter-cell margin guideline greatly improves the agreement between the finite-difference time-domain (FDTD) RCS of the rod and cylinder targets and the measured RCS
Keywords :
computerised instrumentation; microwave measurement; radar cross-sections; radar theory; computer code validation; contour map; cylinder targets; finite difference time domain RCS; incidence angle; microwave measurement; numerical computations; radar cross-section measurements; reference; rod; wire-grid models; Finite difference methods; Frequency; Geometry; Guidelines; Interference; Radar cross section; Radar scattering; Resonance; Time domain analysis; Wire;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.278545
Filename :
278545
Link To Document :
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