Long-term fluctuations associated with different standards

Author

Valdes, Joaquin ; Porfiri, Marta E. ; Lobbe, Emilio E. ; Kornblit, Fernando ; De Marques, Mixta N Passarino ; Leiblich, Juan A.

Author_Institution

Dept. de Fisica y Metrol., Inst. Nacional de Tecnologia Ind., Buenos Aires, Argentina

Volume

42

Issue

2

fYear

1993

fDate

4/1/1993 12:00:00 AM

Firstpage

269

Lastpage

272

Abstract

Standards maintenance is made by repeated measurements over long periods of time. In the presence of divergent low-frequency noise, the longer the observation time, the greater the measurement uncertainty. Long-term fluctuations associated with standard resistors, voltage standard cells. standard weights, and the measuring equipment used are discussed. Groups of these standards are periodically compared at definite time intervals. Spectrum signal analysis is carried out by discrete Fourier transformation, showing in some cases 1/fⁿ power spectra with different values of n

Keywords

electric resistance measurement; fast Fourier transforms; fluctuations; mass measurement; measurement standards; resistors; spectral analysis; voltage measurement; discrete Fourier transformation; divergent low-frequency noise; fluctuations; mass standards; measurement standards maintenance; power spectra; standard resistors; standard weights; time domain analysis; voltage standard cells; Circuit noise; Fluctuations; Frequency; Low-frequency noise; Measurement standards; Measurement uncertainty; Noise measurement; Power measurement; Resistors; Time measurement;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.278563

Filename

278563