Title :
Limitation of the clock frequency stability by the interrogation frequency noise: experimental results
Author :
Barillet, R. ; Giordano, Vincent ; Viennet, Jacques ; Audoin, Claude
Author_Institution :
Lab. de l´´Horloge Atomique, Univ. Paris-Sud, Orsay, France
fDate :
4/1/1993 12:00:00 AM
Abstract :
Recent advances in atomic physics will make it possible to reach frequency stabilities in the range of 10-14-1015 τ-1/2 for passive atomic frequency standards. However, it is recognized that the frequency noise in the interrogating microwave signal limits the frequency stability, approximately to the range 10-12-10-13 τ-1/2, depending on the spectral purity of the VCXO and on the modulation frequency f M. In order to investigate this effect experimentally, two identical microwave generators are realized at 9192 MHz. These two microwave generators enable one to measure the power spectral density (PSD) of their frequency fluctuations with or without additive frequency noise, and to characterize separately the limit of the frequency stability related to the interrogation frequency noise. The relation between the microwave frequency noise at 2nfM and the frequency stability limit is verified: experimental results very precisely confirm the predictions of the model for slow modulation frequencies. In any case, the spurious effect is related only to the frequency noise present in the microwave interrogation at Fourier frequencies which are even harmonics of the modulation frequency
Keywords :
atomic clocks; crystal resonators; electric noise measurement; frequency measurement; frequency stability; frequency synthesizers; harmonics; measurement standards; microwave generation; microwave measurement; variable-frequency oscillators; 9192 MHz; Fourier frequencies; VCXO; clock frequency stability; even harmonics; frequency fluctuations; frequency noise; interrogating microwave signal; interrogation frequency noise; microwave frequency noise; microwave generators; modulation frequency; passive atomic frequency standards; power spectral density; spectral purity; spurious effect; voltage controlled crystal oscillator; Additive noise; Atomic clocks; Character generation; Density measurement; Frequency modulation; Microwave generation; Noise generators; Physics; Power generation; Stability;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on