Title :
Passing electrons one by one: is a 10-8 accuracy achievable?
Author :
Pothier, H. ; Lafarge, P. ; Esteve, D. ; Urbina, C. ; Devoret, Michel H.
Author_Institution :
Service de Phys. de l´´Etat Condense, CEA-Saclay, Gif-sur-Yvette, France
fDate :
4/1/1993 12:00:00 AM
Abstract :
The error mechanisms of the single electron pump with an arbitrary number of junctions are analyzed. An upper bound for the error probability is computed analytically at zero temperature. It is shown that a 10-8 accuracy is achievable for devices with five or more junctions
Keywords :
beam handling equipment; beam handling techniques; charge measurement; constants; electric current measurement; error statistics; tunnelling; A representation; N junction pump; ampere; constants; error probability; junctions; metrology; single electron pump; units; Capacitors; Current measurement; Electrodes; Electrons; Error analysis; Error probability; Frequency; Helium; Temperature distribution; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
