DocumentCode
1059529
Title
Tracing the complex RE reflection coefficient in the MHz range back to DC resistance standards by utilizing planar NiCr thin-film resistors
Author
Stumper, Ulrich ; Grno, Ladislav ; Janik, Dieter ; Peinelt, Wolfgang ; Weimman, T.
Author_Institution
Phys.-Tech. Bundesanstalt, Braunschweig, Germany
Volume
42
Issue
2
fYear
1993
fDate
4/1/1993 12:00:00 AM
Firstpage
351
Lastpage
355
Abstract
A method to determine the three error box parameters of complex reflectometers is proposed where a number of planar NiCr thin-film resistors mounted in identical coaxial connectors and traced back to DC resistance standards are used. First experimental results show that this method seems to be applicable to frequencies up to about 500 MHz
Keywords
chromium alloys; electric resistance measurement; measurement standards; nickel alloys; thin film resistors; 500 MHz; DC resistance standards; NiCr; coaxial connectors; complex RE reflection coefficient; complex reflectometers; planar resistors; thin-film resistors; three error box parameters; Calibration; Coaxial components; Connectors; Dielectrics; Radio frequency; Reflection; Resistors; Skin; Sputtering; Transistors;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.278580
Filename
278580
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