Title :
Tracing the complex RE reflection coefficient in the MHz range back to DC resistance standards by utilizing planar NiCr thin-film resistors
Author :
Stumper, Ulrich ; Grno, Ladislav ; Janik, Dieter ; Peinelt, Wolfgang ; Weimman, T.
Author_Institution :
Phys.-Tech. Bundesanstalt, Braunschweig, Germany
fDate :
4/1/1993 12:00:00 AM
Abstract :
A method to determine the three error box parameters of complex reflectometers is proposed where a number of planar NiCr thin-film resistors mounted in identical coaxial connectors and traced back to DC resistance standards are used. First experimental results show that this method seems to be applicable to frequencies up to about 500 MHz
Keywords :
chromium alloys; electric resistance measurement; measurement standards; nickel alloys; thin film resistors; 500 MHz; DC resistance standards; NiCr; coaxial connectors; complex RE reflection coefficient; complex reflectometers; planar resistors; thin-film resistors; three error box parameters; Calibration; Coaxial components; Connectors; Dielectrics; Radio frequency; Reflection; Resistors; Skin; Sputtering; Transistors;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
