• DocumentCode
    105953
  • Title

    Sub-60-fs Timing Jitter of a SESAM Modelocked VECSEL

  • Author

    Wittwer, V.J. ; van der Linden, Ruud ; Tilma, B.W. ; Resan, Bojan ; Weingarten, Kurt J. ; Sudmeyer, Thomas ; Keller, Ulrich

  • Author_Institution
    Dept. of Phys., ETH Zurich, Zurich, Switzerland
  • Volume
    5
  • Issue
    1
  • fYear
    2013
  • fDate
    Feb. 2013
  • Firstpage
    1400107
  • Lastpage
    1400107
  • Abstract
    We present noise measurements of a pulse train emitted from an actively stabilized semiconductor-saturable-absorber-mirror (SESAM) modelocked vertical external cavity surface emitting laser (VECSEL). The laser generated 6-ps pulses with 2-GHz pulse-repetition rate and 40-mW average output power. The repetition rate was phase locked to a reference source using a piezo actuator. The timing phase noise power spectral density of the laser output was detected with a highly linear photodiode and measured with a signal source analyzer. The resulting RMS timing jitter integrated over an offset frequency range from 1 Hz to 100 MHz gives a value of below 60 fs, lower than previous modelocked VECSELs and comparable with the noise performance of ion-doped solid-state lasers. The RMS amplitude noise was below 0.4% (1 Hz to 40 MHz) and not influenced by the timing phase stabilization.
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; laser mirrors; laser mode locking; laser noise; laser stability; laser variables measurement; noise measurement; optical pulse generation; optical saturable absorption; phase noise; photodiodes; quantum well lasers; surface emitting lasers; timing jitter; InGaAs; RMS amplitude noise; RMS timing jitter; SESAM; VECSEL; frequency 1 Hz to 100 MHz; frequency 2 GHz; mode locking; noise measurements; photodiode; piezo actuator; power 40 mW; pulse train; semiconductor-saturable-absorber-mirror; signal source analyzer; time 6 ps; timing phase noise power spectral density; timing phase stabilization; vertical external cavity surface emitting laser; Laser modes; Laser noise; Laser stability; Measurement by laser beam; Surface emitting lasers; Timing jitter; Photon sources; diode-pumped lasers; infrared lasers; modelocked lasers; semiconductor lasers; ultrafast lasers;
  • fLanguage
    English
  • Journal_Title
    Photonics Journal, IEEE
  • Publisher
    ieee
  • ISSN
    1943-0655
  • Type

    jour

  • DOI
    10.1109/JPHOT.2012.2236546
  • Filename
    6395234