Integrated injection logic for a linear/digital LSI environment

The dc and transient performance of Integrated Injection Logic (I²L) structures in a linear/digital LSI environment is analyzed and modeled. The analysis is based on a functional modeling approach and uses a one-dimensional regional computer device analysis program which includes heavy doping effects and doping level mobility dependence. The computed results are used to evaluate the performance of I²L structures in five bioplar technologies. Means of decreasing the effective epitaxial layer thickness and decreasing the effective epi-resistivities of the I²L part of the chip, without affecting the breakdown voltage of the linear part, are given and evaluated. The computed results are compared to experiments.