• DocumentCode
    1059554
  • Title

    Synchrotron Radiation Techniques for the Characterization of {\\rm Nb}_{3}{\\rm Sn} Superconductors

  • Author

    Scheuerlein, Christian ; Di Michiel, M. ; Buta, Florin

  • Author_Institution
    Accel. Technol. Dept., CERN, Geneva, Switzerland
  • Volume
    19
  • Issue
    3
  • fYear
    2009
  • fDate
    6/1/2009 12:00:00 AM
  • Firstpage
    2653
  • Lastpage
    2656
  • Abstract
    The high flux of high energy X-rays that can be provided through state-of-the-art high energy synchrotron beam lines has enabled a variety of new experiments with the highly absorbing Nb3Sn superconductors. We report different experiments with Nb3Sn strands that have been conducted at the ID15 High Energy Scattering beam line of the European Synchrotron Radiation Facility (ESRF). Synchrotron X-ray diffraction has been used in order to monitor phase transformations during in-situ reaction heat treatments prior to Nb3Sn formation, and to monitor Nb3Sn growth. Fast synchrotron micro-tomography was applied to study void growth during the reaction heat treatment of Internal Tin strands. The elastic strain in the different phases of fully reacted Nb3Sn composite conductors has been measured by high resolution X-ray diffraction during in-situ tensile tests.
  • Keywords
    X-ray diffraction; computerised tomography; heat treatment; niobium alloys; superconducting transitions; tin alloys; type II superconductors; voids (solid); European Synchrotron Radiation Facility; ID15 high energy scattering beam line; Nb3Sn; fast synchrotron microtomography; high resolution X-ray diffraction; in-situ reaction heat treatments; in-situ tensile tests; phase transformations; reaction heat treatment; superconductors; synchrotron X-ray diffraction; synchrotron radiation techniques; void growth; Diffraction; superconducting wires and filaments; tomography;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/TASC.2009.2019101
  • Filename
    5067090