• DocumentCode
    1059563
  • Title

    Modeling and detection of transformer internal incipient fault during impulse test

  • Author

    Naderi, Mehdi S. ; Gharehpetian, G.B. ; Abedi, M. ; Blackburn, T.R.

  • Author_Institution
    Amirkabir Univ. of Technol., Tehran
  • Volume
    15
  • Issue
    1
  • fYear
    2008
  • fDate
    2/1/2008 12:00:00 AM
  • Firstpage
    284
  • Lastpage
    291
  • Abstract
    Incipient faults are low magnitude and fast decaying transients, lasting only for a few microseconds during impulse tests of transformers. They are very difficult to detect, even for experts, and may cause severe problems leading to faults and consequent outage. Thus, simulation and diagnosis of incipient faults is very important requiring a valid model and advanced detection technique. In this paper, a new arc discharge model is proposed to simulate arcing phenomena between two discs of a power transformer winding, as one type of important incipient fault, during impulse test. Using wavelet transform techniques, a new methodology is developed. It is shown that winding input current, affected by arcing phenomena and obtained through impulse voltage test, provides important information for detection and analysis of this transient type of minor fault. A number of experiments and simulations were performed to evaluate the validity and accuracy of proposed model and diagnostic technique.
  • Keywords
    arcs (electric); impulse testing; power transformer protection; wavelet transforms; advanced detection technique; arc discharge model; arcing phenomena; fast decaying transients; impulse test; power transformer winding; transformer internal incipient fault; wavelet transform; winding input current; Arc discharges; Circuit faults; Circuit simulation; Electrical fault detection; Fault detection; Impulse testing; Insulation testing; Power transformer insulation; Power transformers; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Dielectrics and Electrical Insulation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1070-9878
  • Type

    jour

  • DOI
    10.1109/T-DEI.2008.4446762
  • Filename
    4446762