DocumentCode :
1059632
Title :
Accurate determination of the density of a crystal silicon sphere
Author :
Fujii, Ken-ichi ; Tanaka, Mitsuru ; Nezu, Yoshiaki ; Nakayama, Kan ; Masui, Ryohei
Author_Institution :
Nat. Res. Lab. of Metrol., Ibaraki, Japan
Volume :
42
Issue :
2
fYear :
1993
fDate :
4/1/1993 12:00:00 AM
Firstpage :
395
Lastpage :
400
Abstract :
For an independent determination of the Avogadro constant, the density of a 1-kg crystal silicon sphere was determined by direct measurements of its mass and volume. A scanning-type interferometer was used to measure the diameters, and the volume was calculated from the mean of uniformly distributed diameters. The sphere was weighted using a balance for the prototype kilogram at the National Research Laboratory of Metrology (NRLM), and the mass was determined accurately by direct measurements of the buoyancy force acting on the sphere. The total uncertainty of the density is estimated to be 0.34 ppm. Effects of a thin oxide layer and impurities on the density of a pure crystal are evaluated
Keywords :
constants; density measurement; elemental semiconductors; light interferometry; silicon; Avogadro constant; National Research Laboratory of Metrology; Si sphere; balance; buoyancy force; density measurement; diameters; impurities; prototype kilogram; pure crystal; scanning-type interferometer; thin oxide layer; uncertainty; volume; Density measurement; Force measurement; Mechanical variables measurement; Metrology; NIST; Optical interferometry; Prototypes; Silicon; Steel; Volume measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.278589
Filename :
278589
Link To Document :
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