EM Modeling of Microstrip Conductor Losses Including Surface Roughness Effect

Author

Chen, Xiaoming

Author_Institution

BreconRidge, Inc, Ottawa, Ont.

Volume

17

Issue

2

fYear

2007

Firstpage

94

Lastpage

96

Abstract

This letter presents a method to model conductor losses in transmission lines utilizing a commercial full wave solver. The lines consist of multilayered metallization with inherent surface roughness. Metal thickness is assumed to be larger than skin depth. To validate accuracy of the modeling, the measurements of a 50-Omega microstrip line and edge-coupled microstrip filter are provided, with random errors taken into account. Good correlation between the modeled results and measurements has been demonstrated from this comparison

Keywords

computational electromagnetics; losses; microstrip filters; microstrip lines; surface roughness; waveguide theory; edge-coupled microstrip filter; electromagnetic modeling; full wave solver; microstrip conductor losses; microstrip line; multilayered metallization; surface roughness effect; transmission lines; Conducting materials; Conductors; Distributed parameter circuits; Loss measurement; Metallization; Microstrip filters; Propagation losses; Rough surfaces; Surface roughness; Transmission line measurements; Electromagnetic (EM) modeling; losses; measurement; multilayers; rough surfaces; transmission lines;

fLanguage

English

Journal_Title

Microwave and Wireless Components Letters, IEEE

Publisher

ieee

ISSN

1531-1309

Type

jour

DOI

10.1109/LMWC.2006.890326

Filename

4079644