DocumentCode
1059850
Title
Emitter current-crowding in high-voltage transistors
Author
Hower, Philip L. ; Einthoven, Willem G.
Author_Institution
Westinghouse Research Laboratories, Pittsburgh, PA
Volume
25
Issue
4
fYear
1978
fDate
4/1/1978 12:00:00 AM
Firstpage
465
Lastpage
471
Abstract
The problem of emitter current-crowding is treated for the case where the base is heavily doped with respect to the collector and the transistor is operating in the quasisaturation region. Closed-form solutions for terminal currents and current gain are derived in terms of elliptic integrals and other related functions. Good agreement with experimental data is demonstrated and various design implications of the theory are discussed.
Keywords
Charge carrier density; Charge carrier processes; Closed-form solution; Current density; Doping; Electron mobility; Impurities; Laboratories; Solids; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1978.19108
Filename
1479502
Link To Document