DocumentCode :
1059850
Title :
Emitter current-crowding in high-voltage transistors
Author :
Hower, Philip L. ; Einthoven, Willem G.
Author_Institution :
Westinghouse Research Laboratories, Pittsburgh, PA
Volume :
25
Issue :
4
fYear :
1978
fDate :
4/1/1978 12:00:00 AM
Firstpage :
465
Lastpage :
471
Abstract :
The problem of emitter current-crowding is treated for the case where the base is heavily doped with respect to the collector and the transistor is operating in the quasisaturation region. Closed-form solutions for terminal currents and current gain are derived in terms of elliptic integrals and other related functions. Good agreement with experimental data is demonstrated and various design implications of the theory are discussed.
Keywords :
Charge carrier density; Charge carrier processes; Closed-form solution; Current density; Doping; Electron mobility; Impurities; Laboratories; Solids; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1978.19108
Filename :
1479502
Link To Document :
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