Title :
The effect of ionizing radiation on mobile ion current peaks in MOS capacitors
Author :
Repace, James L.
Author_Institution :
Naval Research Laboratory, Washington, DC
fDate :
4/1/1978 12:00:00 AM
Abstract :
MOS capacitors were examined for sodium ion concentrations before and after radiation using the high-temperature voltage ramp technique. The radiation caused a field-dependent lateral shift of the Na+displacement current peak along the voltage axis. An explanation is suggested based upon lateral nonuniformities and image forces.
Keywords :
Annealing; Corona; Gamma rays; Government; Ionizing radiation; MOS capacitors; Oxidation; Protection; Temperature; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1978.19113
