Title :
Procedures for the determination of the scattering parameters for network analyzer calibration
Author :
Heuermann, Holger ; Schiek, Burkhard
Author_Institution :
Inst. fuer Hochfrequenztech., Ruhr-Univ. Bochum, Germany
fDate :
4/1/1993 12:00:00 AM
Abstract :
Several methods to determine error-corrected scattering parameters are presented. These methods are applicable to double reflectometer test sets with four measurement channels. One of these methods of calculation is particularly fast and robust. Furthermore, a new method for the calculation of the error-corrected scattering parameters without using error correction coefficients is presented
Keywords :
S-parameters; calibration; microwave reflectometry; network analysers; double reflectometer test sets; error-corrected scattering parameters; network analyzer calibration; Artificial intelligence; Boundary conditions; Calibration; Equations; Error correction; Helium; Robustness; Scattering parameters; Switches; Testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
