Title :
An accurate and repeatable technique for noise parameter measurements
Author :
Boudiaf, Ali ; Laporte, Michel
Author_Institution :
CNET, France Telecom, Bagneux, France
fDate :
4/1/1993 12:00:00 AM
Abstract :
In spite of the improvements in RF instrumentation, network analyzer calibration methods, and measurement techniques, the measurement of noise parameters in highly mismatched systems is particularly prone to error. A homemade automated noise parameter measurement system is described, and a new algorithm for the estimation of the two-port noise parameters is presented. Analytical calculation of the parameter accuracy is developed, by taking into account the measurement uncertainties. The accuracy and the repeatability of the measurements performed with a low-noise HEMT are presented
Keywords :
calibration; computerised instrumentation; electric noise measurement; high electron mobility transistors; least squares approximations; measurement errors; microwave measurement; network analysers; parameter estimation; semiconductor device noise; semiconductor device testing; HEMT; RF instrumentation; accuracy; algorithm; estimation; least squares approximation; measurement uncertainties; mismatched systems; network analyzer calibration; noise measurement; noise parameter measurements; repeatability; semiconductor device; two-port noise parameters; Calibration; Impedance measurement; Instruments; Measurement techniques; Noise figure; Noise measurement; Optimization methods; Particle measurements; Radio frequency; Tuners;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
