• DocumentCode
    1060150
  • Title

    4-GHz 15-W power GaAs MESFET

  • Author

    Fukuta, Masumi ; Mimura, Takashi ; Suzuki, Hidetake ; Suyama, Katsuhiko

  • Author_Institution
    Fujitsu Laboratories, Ltd., Kawasaki, Japan
  • Volume
    25
  • Issue
    6
  • fYear
    1978
  • fDate
    6/1/1978 12:00:00 AM
  • Firstpage
    559
  • Lastpage
    563
  • Abstract
    High-field behavior of GaAs MESFET´s such as drain-source breakdown characteristics and visible light emission and a model explaining these phenomena are described. An FET structure with a high drain-source breakdown voltage in excess of 26 V has been developed following an analysis of the high-field behavior of the device. Typical characteristics of the fabricated devices at 4 GHz are as follows: Pout= 9.6 W Ga= 5 dB ηadd= 33.6 percent at 18 V from single chip (WG= 13 mm) Pout= 15 W Ga= 5 dB ηadd= 28.3 percent at 22 V from two chip (WG= 26 mm) where Pout, Ga, ηadd, and WGindicate the output power, associated power gain, power added efficiency, and total gate width of the FET´s, respectively.
  • Keywords
    Avalanche photodiodes; Breakdown voltage; Current measurement; Electric breakdown; FETs; Gallium arsenide; Length measurement; MESFETs; Microscopy; Silicon;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/T-ED.1978.19136
  • Filename
    1479530