DocumentCode
1060150
Title
4-GHz 15-W power GaAs MESFET
Author
Fukuta, Masumi ; Mimura, Takashi ; Suzuki, Hidetake ; Suyama, Katsuhiko
Author_Institution
Fujitsu Laboratories, Ltd., Kawasaki, Japan
Volume
25
Issue
6
fYear
1978
fDate
6/1/1978 12:00:00 AM
Firstpage
559
Lastpage
563
Abstract
High-field behavior of GaAs MESFET´s such as drain-source breakdown characteristics and visible light emission and a model explaining these phenomena are described. An FET structure with a high drain-source breakdown voltage in excess of 26 V has been developed following an analysis of the high-field behavior of the device. Typical characteristics of the fabricated devices at 4 GHz are as follows: Pout = 9.6 W Ga = 5 dB ηadd = 33.6 percent at 18 V from single chip (WG = 13 mm) Pout = 15 W Ga = 5 dB ηadd = 28.3 percent at 22 V from two chip (WG = 26 mm) where Pout , Ga , ηadd , and WG indicate the output power, associated power gain, power added efficiency, and total gate width of the FET´s, respectively.
Keywords
Avalanche photodiodes; Breakdown voltage; Current measurement; Electric breakdown; FETs; Gallium arsenide; Length measurement; MESFETs; Microscopy; Silicon;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1978.19136
Filename
1479530
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