DocumentCode :
1060280
Title :
False Discovery Rate for Wavelet-Based Statistical Parametric Mapping
Author :
Van De Ville, Dimitri Van ; Unser, Michael
Author_Institution :
Biomed. Imaging Group, Ecole Polytech- nique Federate de Lausanne, Lausanne
Volume :
2
Issue :
6
fYear :
2008
Firstpage :
897
Lastpage :
906
Abstract :
Model-based statistical analysis of functional magnetic resonance imaging (fMRI) data relies on the general linear model and statistical hypothesis testing. Due to the large number of intracranial voxels, it is important to deal with the multiple comparisons problem. Many fMRI analysis tools utilize Gaussian random field theory to obtain a more sensitive thresholding; this typically involves Gaussian smoothing as a preprocessing step. Wavelet-based statistical parametric mapping (WSPM) is an alternative method to obtain parametric maps from non-smoothed data. It relies on adaptive thresholding of the parametric maps in the wavelet domain, followed by voxel-wise statistical testing. The procedure is conservative; it uses Bonferroni correction for strong type I error control. Yet, its sensitivity is close to SPM´s due to the excellent denoising properties of the wavelet transform. Here, we adapt the false discovery rate (FDR) principle to the WSPM framework. Although explicit p-values cannot be obtained, we show that it is possible to retrieve the FDR threshold by a simple iterative scheme. We then validate the approach with an event-related visual stimulation task. Our results show better sensitivity with preservation of spatial resolution; i.e., activation clusters align well with the gray matter structures in the visual cortex. The spatial resolution of the activation maps is even high enough to easily identify a voxel that is very likely to be caused by the draining-vein effect.
Keywords :
biomedical MRI; brain; medical image processing; neurophysiology; statistical analysis; visual evoked potentials; wavelet transforms; Bonferroni correction; activation clusters; activation maps; false discovery rate; functional magnetic resonance imaging; gray matter structures; spatial resolution preservation; visual cortex; voxel-wise statistical testing; wavelet transform; wavelet-based statistical parametric mapping; Error correction; Magnetic analysis; Magnetic resonance imaging; Noise reduction; Scanning probe microscopy; Smoothing methods; Spatial resolution; Statistical analysis; Testing; Wavelet domain; Bonferroni correction; false discovery rate; functional magnetic resonance imaging; general linear model; parametric hypothesis-driven statistical test; wavelet transform;
fLanguage :
English
Journal_Title :
Selected Topics in Signal Processing, IEEE Journal of
Publisher :
ieee
ISSN :
1932-4553
Type :
jour
DOI :
10.1109/JSTSP.2008.2007762
Filename :
4740312
Link To Document :
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