Title :
Effect of magnetic annealing on plated permalloy and domain configurations in thin-film inductive head
Author :
Kao, Andrew S. ; Kasiraj, Prakash
Author_Institution :
IBM Almaden Res. Center, San Jose, CA, USA
fDate :
11/1/1991 12:00:00 AM
Abstract :
The magnetic annealing behavior of electroplated, 2.00-μm-thick, NiFe films containing nominally 82% Ni, in the temperature range from 100 to 500°C, was investigated through characterization of the structural properties of full films and the domain configurations of films shaped like an inductive-head yoke. A transition in the magnetic properties of the films was observed in the temperature regime of 350-450°C. Concomitant changes in film stress from 0.2 to 1.4 GPa and in magnetostriction from -2.2 to -3.5×10 -6 were measured across the transition. Transmission electron micrographs and X-ray diffraction analysis showed that recrystallization with (111) texturing and extensive grain growth took place at the transition temperature. Kerr microscopy demonstrated that the favorable domain configuration produced in an as-plated test device could be maintained up to the transition temperature
Keywords :
Permalloy; X-ray diffraction examination of materials; coercive force; electroplated coatings; ferromagnetic properties of substances; grain growth; internal stresses; magnetic anisotropy; magnetic annealing; magnetic domains; magnetic heads; magnetic thin film devices; magnetic thin films; magnetic transitions; magnetostriction; recrystallisation texture; transmission electron microscope examination of materials; 100 to 500 degC; Kerr microscopy; NiFe films; TEM; X-ray diffraction analysis; anisotropy field; coercivity; domain configurations; electroplating; film stress; grain growth; inductive-head yoke; magnetic annealing; magnetic transition; magnetostriction; plated permalloy; recrystallization texture; structural properties; thin-film inductive head; Annealing; Electrons; Magnetic analysis; Magnetic domains; Magnetic films; Magnetic properties; Magnetostriction; Stress measurement; Temperature distribution; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on
