DocumentCode :
1060330
Title :
Modes of avalanche oscillations in silicon diodes
Author :
Ward, Alford L.
Author_Institution :
Harry Diamond Laboratories,Adelphi, MD
Volume :
25
Issue :
6
fYear :
1978
fDate :
6/1/1978 12:00:00 AM
Firstpage :
683
Lastpage :
687
Abstract :
A computer program which includes both electronic and thermal processes has been used to study avalanche oscillations in a diode which is punched through only well above breakdown. IMPATT, relaxing avalanche, and MULTIPATT oscillations have been studied. The MULTIPATT mode is shown to be a superpesition of transit-time oscillations upon a relaxation oscillation. It is postulated that the TRAPATT mode is initiated by the IMPATI mode via the MULTIPATI mode. The frequency of the IMPATT oscillations was found to vary with the square root of the current over a factor of 100 in current. For parallel operation of TRAPATT diodes, it is shown that nonpunched-through diodes should be used.
Keywords :
Avalanche breakdown; Electric breakdown; Equations; Oscillators; Read-write memory; Semiconductor diodes; Silicon; Temperature; Thermal conductivity; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1978.19154
Filename :
1479548
Link To Document :
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