DocumentCode
1060330
Title
Modes of avalanche oscillations in silicon diodes
Author
Ward, Alford L.
Author_Institution
Harry Diamond Laboratories,Adelphi, MD
Volume
25
Issue
6
fYear
1978
fDate
6/1/1978 12:00:00 AM
Firstpage
683
Lastpage
687
Abstract
A computer program which includes both electronic and thermal processes has been used to study avalanche oscillations in a diode which is punched through only well above breakdown. IMPATT, relaxing avalanche, and MULTIPATT oscillations have been studied. The MULTIPATT mode is shown to be a superpesition of transit-time oscillations upon a relaxation oscillation. It is postulated that the TRAPATT mode is initiated by the IMPATI mode via the MULTIPATI mode. The frequency of the IMPATT oscillations was found to vary with the square root of the current over a factor of 100 in current. For parallel operation of TRAPATT diodes, it is shown that nonpunched-through diodes should be used.
Keywords
Avalanche breakdown; Electric breakdown; Equations; Oscillators; Read-write memory; Semiconductor diodes; Silicon; Temperature; Thermal conductivity; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/T-ED.1978.19154
Filename
1479548
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