Title :
Modes of avalanche oscillations in silicon diodes
Author_Institution :
Harry Diamond Laboratories,Adelphi, MD
fDate :
6/1/1978 12:00:00 AM
Abstract :
A computer program which includes both electronic and thermal processes has been used to study avalanche oscillations in a diode which is punched through only well above breakdown. IMPATT, relaxing avalanche, and MULTIPATT oscillations have been studied. The MULTIPATT mode is shown to be a superpesition of transit-time oscillations upon a relaxation oscillation. It is postulated that the TRAPATT mode is initiated by the IMPATI mode via the MULTIPATI mode. The frequency of the IMPATT oscillations was found to vary with the square root of the current over a factor of 100 in current. For parallel operation of TRAPATT diodes, it is shown that nonpunched-through diodes should be used.
Keywords :
Avalanche breakdown; Electric breakdown; Equations; Oscillators; Read-write memory; Semiconductor diodes; Silicon; Temperature; Thermal conductivity; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1978.19154