DocumentCode :
1060425
Title :
Spot optical measurements on micromachined mirrors for photonic switching
Author :
Annovazzi-Lodi, Valerio ; Benedetti, Mauro ; Merlo, Sabina ; Norgia, Michele
Author_Institution :
Dipt. di Elettronica, Universita degli Studi di Pavia, Italy
Volume :
10
Issue :
3
fYear :
2004
Firstpage :
536
Lastpage :
544
Abstract :
This paper describes and compares three optical methods for performing spot measurements on micromachined mirrors, designed for photonic switching in fiberoptic networks. For static characterization, two spot-position detection systems, one based on a vidicon camera and the other based on a bidimensional silicon position sensitive detector (PSD), are illustrated, tested, and compared. Moreover, the dynamic behavior has been monitored with the PSD-based detection arrangement and with a semiconductor laser feedback interferometer. Advantages and drawbacks of these methods are highlighted. Testing is reported on torsional, silicon micromachined mirrors, with a single degree of freedom. High dc voltage for static measurements, and sinusoidal or white-noise or step excitation for dynamic characterization, have been used for mirror driving.
Keywords :
light interferometers; light interferometry; micromechanical devices; micromirrors; optical fibre networks; optical testing; optical variables measurement; photonic switching systems; television camera tubes; white noise; bidimensional silicon position sensitive detector; fiberoptic networks; microelectromechanical systems; micromirror; mirror driving; photonic switching; semiconductor laser feedback interferometer; silicon micromachined mirrors; sinusoidal noise; spot measurements; spot optical measurements; spot-position detection systems; static characterization; step excitation; torsional micromachined mirrors; vidicon camera; white noise; Laser feedback; Mirrors; Optical design; Optical feedback; Optical fiber networks; Optical interferometry; Optical sensors; Performance evaluation; Position sensitive particle detectors; Silicon; Interferometry; MEMS; MEMS testing; MOEMS; characterization; microelectromechanical systems; microoptoelectromechanical systems; optical measurements;
fLanguage :
English
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
Publisher :
ieee
ISSN :
1077-260X
Type :
jour
DOI :
10.1109/JSTQE.2004.830625
Filename :
1323058
Link To Document :
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