DocumentCode :
1060455
Title :
Characteristics of static induction transistors: Effects of series resistance
Author :
Mochida, Yasunori ; Nishizawa, Jun-ichi ; Ohmi, Tadahiro ; Gupta, R.K.
Author_Institution :
Nippon Gakki Company, Ltd., Hamamatsu, Japan
Volume :
25
Issue :
7
fYear :
1978
fDate :
7/1/1978 12:00:00 AM
Firstpage :
761
Lastpage :
767
Abstract :
It is established experimentally that the I-V characteristics of a static induction transistor (SIT) and their temperature dependence are consistent with a major current transport mechanism of majority-carrier injection control plus the effect of series channel resistance. The I-V characteristics follow an exponential behavior in the low-current region and change to approximately a linear-or square-law relation in the high-current region where the negative feedback effect of the series channel resistance becomes pronounced. That the series channel resistance is small in the SIT and satisfies the condition that the product of series channel resistance and dc intrinsic transconductanee is less than unity is experimentally verified. The voltage amplification factor in the SIT has been confirmed to be almost constant for wide variations of drain current and ambient temperature.
Keywords :
Electric resistance; Equivalent circuits; FETs; Helium; Linear approximation; Negative feedback; Temperature control; Temperature dependence; Transconductance; Voltage;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/T-ED.1978.19167
Filename :
1479561
Link To Document :
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