DocumentCode :
1060734
Title :
Response of magnetization to high frequency excitation in inductive thin-film recording heads
Author :
Shi, Xizeng ; Koeppe, Peter V. ; Kryder, Mark H.
Author_Institution :
Data Storage Syst. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
Volume :
27
Issue :
6
fYear :
1991
fDate :
11/1/1991 12:00:00 AM
Firstpage :
4942
Lastpage :
4944
Abstract :
A scanning magnetooptic photometer system was used to study the high-frequency response of magnetization in inductive thin-film recording heads. Measurements at 40 MHz show that most domain walls cease to move at this frequency. At the surface of these motionless walls, the magnetization does not respond to the applied field, forming a dead surface layer. On the two sides of these motionless domain walls, magnetic flux conduction is by nonuniform rotation in the sense that both the rotation angle and the phase are different at different places, forming magnetic flux ripples. Locked ripple was previously shown to significantly slow magnetization reversal in thin Permalloy films, and these measurement results indicate it will likely limit high-frequency performance of thin-film heads as well
Keywords :
magnetic domain walls; magnetic heads; magnetic switching; magnetic thin film devices; magnetisation reversal; 40 MHz; dead surface layer; domain wall movement; high frequency excitation; high-frequency response; inductive thin-film recording heads; magnetic flux conduction; magnetic flux ripples; magnetic heads; magnetization; magnetization reversal; motionless walls; nonuniform rotation; scanning magnetooptic photometer system; thin Permalloy films; Frequency measurement; Magnetic domain walls; Magnetic field measurement; Magnetic films; Magnetic flux; Magnetic heads; Magnetization reversal; Magnetooptic recording; Photometry; Transistors;
fLanguage :
English
Journal_Title :
Magnetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9464
Type :
jour
DOI :
10.1109/20.278703
Filename :
278703
Link To Document :
بازگشت