Title :
Guest Editorial: Reliability and Quality Case Studies
Author_Institution :
Dept. of Elec. and Computer Eng., Clemson Univ., Clemson, SC
fDate :
10/1/1986 12:00:00 AM
Keywords :
Bit error rate; Circuit testing; Copper; Optical design; Optical fiber cables; Optical fiber devices; Optical fiber networks; Optical network units; Optical transmitters; Repeaters;
Journal_Title :
Selected Areas in Communications, IEEE Journal on
DOI :
10.1109/JSAC.1986.1146434
