DocumentCode :
106121
Title :
In Situ Study of Nb Oxide and Hydride for SRF Cavity Applications Using Aberration-Corrected STEM and Electron Energy Loss Spectroscopy
Author :
Tao, R. ; Klie, R.F.
Author_Institution :
Phys. Dept., Univ. of Illinois at Chicago, Chicago, IL, USA
Volume :
23
Issue :
3
fYear :
2013
fDate :
Jun-13
Firstpage :
7100703
Lastpage :
7100703
Abstract :
Nb is the preferred material for superconducting radio-frequency (SRF) cavities in next-generation particle accelerators, but also exhibits a high solubility for oxygen and hydrogen, especially within the RF-field penetration depth. Using electron diffraction, we observe superlattice reflections near the SRF cavities surface at 300 K and 95 K, which are related to the ordering of oxygen and hydrogen atoms in the niobium crystal. High-resolution scanning transmission electron microscopy images allow direct observation of light atoms, such as hydrogen, carbon and oxygen, and combined with EELS, we can reveal the element composition at grain boundaries and precipitates near the cavity surface. These changes in local composition will be related to the different cavity processing methods.
Keywords :
electron diffraction; electron energy loss spectra; grain boundaries; niobium compounds; particle accelerators; precipitation; scanning-transmission electron microscopy; solubility; superconducting microwave devices; superconducting superlattices; EELS; NbH; NbOx; RF-field penetration depth; SRF cavity applications; aberration-corrected STEM; electron diffraction; electron energy loss spectroscopy; grain boundaries; high-resolution scanning transmission electron microscopy; in situ study; next-generation particle accelerators; precipitates; solubility; superconducting radio-frequency cavity; superlattice reflections; temperature 300 K; temperature 95 K; Cavity resonators; Grain boundaries; Hydrogen; Impurities; Niobium; Surface treatment; EELS; Kirkland code; niobium oxide; superconducting;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2012.2236380
Filename :
6395248
Link To Document :
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