Mo-Based Proximity Bilayers for TES: Microstructure and Properties

Author

Fàbrega, Lourdes ; Fernández-Martínez, Iván ; Gil, Óscar ; Parra-Borderías, María ; Camón, Agustín ; Costa-Krämer, José-Luis ; González-Arrabal, Raquel ; Sesé, Javier ; Briones, Fernando ; Santiso, José ; Peiró, Francesca

Author_Institution

Inst. de Cienc. de Mater. de Barcelona (CSIC), Bellaterra, Spain

Volume

19

Issue

3

fYear

2009

fDate

6/1/2009 12:00:00 AM

Firstpage

460

Lastpage

464

Abstract

We report on the fabrication and characterization of Mo films, Mo/Au and Mo/Cu bilayers for Transition Edge Sensors (TES). The fabrication conditions (at room temperature) have been varied to achieve layers with the required properties for TES applications. The dependence of their functional properties (i.e. electrical resistivity and superconducting critical temperature) on microstructure (grain size, stress) is investigated.

Keywords

copper; electrical resistivity; gold; grain size; molybdenum; proximity effect (superconductivity); superconducting materials; superconducting particle detectors; superconducting thin films; superconducting transition temperature; Mo; Mo-Au; Mo-Cu; electrical resistivity; functional properties; grain size; superconducting critical temperature; transition edge sensors; Proximity effect; radiation detectors; stress; transition edge sensors;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2009.2019052

Filename

5067232