Title :
Relation Between Delay Line Phase Noise and Ring Oscillator Phase Noise
Author :
Homayoun, Aliakbar ; Razavi, Behzad
Author_Institution :
Electr. Eng. Dept., Univ. of California, Los Angeles, Los Angeles, CA, USA
Abstract :
The phase noise of a ring oscillator can be obtained by multiplying its open-loop phase noise by a simple shaping function. The shaping function is computed using first principles and is applicable to both flicker-noise-induced and white-noise-induced phase noise, leading to compact equations for ring oscillators. It is also shown that flicker noise upconversion in ring oscillators is primarily a function of the total gate capacitance and inevitable regardless of the risetime and falltime symmetry. Two oscillator prototypes fabricated in 65-nm CMOS technology verify the validity of the results.
Keywords :
CMOS integrated circuits; delay lines; flicker noise; phase noise; white noise; CMOS technology; compact equations; delay line; first principles; flicker noise upconversion; open-loop phase noise; oscillator prototypes; ring oscillator; simple shaping function; size 65 nm; white noise; Delay lines; Inverters; Jitter; Logic gates; Phase noise; Ring oscillators; Flicker noise; inverter phase noise; jitter; oscillator phase noise; phase noise; white noise;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2013.2289893