Title :
Tunneling stabilized magnetic force microscopy of YBa2Cu 3O7-δ films on MgO at 76 K
Author :
Rice, Paul ; Moreland, John
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
fDate :
11/1/1991 12:00:00 AM
Abstract :
Tunneling stabilized magnetic force microscopy (TSMFM) is an elementary variation of scanning tunneling microscopy (STM). As in STM, a sharp conductive tip is scanned across a conductive sample with an electrical potential applied. As the tip is scanned, changes in tunneling current are plotted on a computer screen as a topographical image. The difference between STM and TSMFM is that the TSMFM tip is made from a flexible magnetic film which deflects in response to sample surface magnetic forces. Pinning of the Abrikosov flux lattice in high-temperature superconductors determines the critical current. TSMFM has been applied to these high-temperature superconductors. Images of sputter-deposited YBa2Cu3O7-δ films below the critical temperature are presented
Keywords :
barium compounds; critical currents; flux pinning; flux-line lattice; high-temperature superconductors; magnetic force microscopy; superconducting thin films; superconductive tunnelling; yttrium compounds; 76 K; Abrikosov flux lattice; MgO substrate; YBa2Cu3O7-δ films; critical current; flux pinning; high-temperature superconductor; sharp conductive tip; sputter-deposited; topographical image; tunneling current; tunnelling stabilised magnetic force microscopy; Critical current; Electric potential; High temperature superconductors; Lattices; Magnetic films; Magnetic force microscopy; Magnetic forces; Magnetic tunneling; Response surface methodology; Surface topography;
Journal_Title :
Magnetics, IEEE Transactions on
