Interpretation of magnetic domain images and electron diffraction patterns in Lorentz microscopy

Author

Byun, C. ; Rauch, G.C. ; Ramaswamy, S. ; Greggi, J., Jr.

Author_Institution

Digital Equipment Corp., Colorado Springs, CO, USA

Volume

27

Issue

6

fYear

1991

fDate

11/1/1991 12:00:00 AM

Firstpage

5190

Lastpage

5192

Abstract

Lorentz TEM (transmission electron microscopy) images and associated electron diffraction patterns of magnetic domains recorded on thin-film media under various conditions are described. Various patterns of deflected diffraction spots are observed, depending on the state of magnetization of the specimen. Black and white contrast in Foucault images is controlled by the position of the aperture and results from both the magnetization distribution in the ferromagnetic thin-film specimen and the fringing fields above and below the specimen. Also shown is the effect of overwrite currents on the domain images

Keywords

electron diffraction examination of materials; hard discs; magnetic domains; magnetic thin films; magnetisation; transmission electron microscope examination of materials; transmission electron microscopy; Foucault images; Lorentz microscopy; TEM; deflected diffraction spots; domain images; effect of overwrite currents; electron diffraction patterns; fringing fields; magnetic domain images; magnetization distribution; thin-film media; Apertures; Control systems; Diffraction; Electron beams; Electron microscopy; Lenses; Lighting; Magnetic domains; Magnetic force microscopy; Magnetization;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.278783

Filename

278783