Investigation of light enhancement of diffusion length by DC photovoltaic current measurement

We describe a simple dc photocurrent measurement technique to investigate the phenomenon of light-enhanced diffusion length in silicon solar cells. We demonstrate that the observed superlinearity of the photocurrent response as a function of photon flux intensity is closely correlated with the enhancement effect for cells containing defects. At the long-wavelength limit, the results of calculations agree reasonably well with those obtained from ac spectral response measurements.