DocumentCode
106183
Title
Optimization of
Antiperovskite Compound Fabrication for Resistance Standard
Author
Oe, Takehiko ; Urano, Chiharu ; Hadano, M. ; Ozawa, Akira ; Takenaka, Kana ; Kaneko, Naoya
Author_Institution
Nat. Inst. of Adv. Ind. Sci. & Technol., Nat. Metrol. Inst. of Japan, Tsukuba, Japan
Volume
62
Issue
6
fYear
2013
fDate
Jun-13
Firstpage
1450
Lastpage
1453
Abstract
We performed a detailed evaluation of the temperature coefficient of resistance of manganese nitride antiperovskite compounds, i.e., Mn3Ag1-xCuxN, around 23 °C. The second-order term of the temperature coefficient β was found to show a rough correlation with the Cu content. For a Cu content x = 0.4, the compound Mn3Ag0.6Cu0.4 N shows the lowest temperature coefficients. The drift rate of the samples was also investigated. The drift rate was suppressed to about 1/30 by higher temperature annealing, and the lowest drift rate was 9.1 (μΩ/Ω)/year. We expect that this antiperovskite compound will be useful for precision resistors and improve the temperature coefficient of resistors by process optimization so that they can be used to produce standard resistors for example.
Keywords
annealing; electric resistance measurement; magnesium compounds; measurement standards; antiperovskite compound fabrication; drift rate; process optimization; resistance standard; rough correlation; temperature annealing; temperature coefficient of resistance evaluation; Annealing; Compounds; Educational institutions; Resistance; Standards; Temperature dependence; Temperature measurement; $hbox{Mn}_{3}hbox{Ag}_{1 - x}hbox{Cu}_{x}hbox{N}$ ; Antiperovskite compound; DC resistance standard; drift rate; standard resistor; temperature coefficient of resistance;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/TIM.2012.2230794
Filename
6395253
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