Title :
Optimization of
Antiperovskite Compound Fabrication for Resistance Standard
Author :
Oe, Takehiko ; Urano, Chiharu ; Hadano, M. ; Ozawa, Akira ; Takenaka, Kana ; Kaneko, Naoya
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Nat. Metrol. Inst. of Japan, Tsukuba, Japan
Abstract :
We performed a detailed evaluation of the temperature coefficient of resistance of manganese nitride antiperovskite compounds, i.e., Mn3Ag1-xCuxN, around 23 °C. The second-order term of the temperature coefficient β was found to show a rough correlation with the Cu content. For a Cu content x = 0.4, the compound Mn3Ag0.6Cu0.4 N shows the lowest temperature coefficients. The drift rate of the samples was also investigated. The drift rate was suppressed to about 1/30 by higher temperature annealing, and the lowest drift rate was 9.1 (μΩ/Ω)/year. We expect that this antiperovskite compound will be useful for precision resistors and improve the temperature coefficient of resistors by process optimization so that they can be used to produce standard resistors for example.
Keywords :
annealing; electric resistance measurement; magnesium compounds; measurement standards; antiperovskite compound fabrication; drift rate; process optimization; resistance standard; rough correlation; temperature annealing; temperature coefficient of resistance evaluation; Annealing; Compounds; Educational institutions; Resistance; Standards; Temperature dependence; Temperature measurement; $hbox{Mn}_{3}hbox{Ag}_{1 - x}hbox{Cu}_{x}hbox{N}$ ; Antiperovskite compound; DC resistance standard; drift rate; standard resistor; temperature coefficient of resistance;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
DOI :
10.1109/TIM.2012.2230794