DocumentCode

1061984

Title

TP-A1 shallow-level electron traps in SiO2

Author

Ning, Tak H.

Volume

25

Issue

11

fYear

1978

fDate

11/1/1978 12:00:00 AM

Firstpage

1348

Lastpage

1348

Keywords

Aluminum; Boats; Electron traps; FETs; Heating; Human computer interaction; Radio frequency; Silicon; Temperature; Threshold voltage;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/T-ED.1978.19314

Filename

1479708