Title :
Evolution of the soft error rate model
Author :
Hardy, P. ; Malone, D.J.
Author_Institution :
IBM Channel Technol., San Jose, CA, USA
fDate :
11/1/1991 12:00:00 AM
Abstract :
Soft error rate (SER) models have been used within IBM since the early sixties to determine the capacity capabilities, of diskfiles. Most models consider the data handling capabilities and the mechanical misregistration to determine the TPI for a given system error rate. Recent models have been used to estimate factory yields, field performance distributions, and the effects of manufacturing tolerances. The authors describe the most recent hybrid models which are used for estimating soft error rates on high TPI designs. Particular attention is given to the modified hybrid SER model and the stress model
Keywords :
error handling; magnetic disc storage; capacity capabilities; data handling capabilities; diskfiles; high TPI designs; hybrid models; mechanical misregistration; stress model; Data handling; Error analysis; Histograms; Integrated circuit noise; Magnetic heads; Production facilities; Signal to noise ratio; Virtual manufacturing; Writing; Yield estimation;
Journal_Title :
Magnetics, IEEE Transactions on