Title :
Magnetic properties and structure in Co-based nitride thin films
Author :
Ohmori, H. ; Katori, K. ; Hayashi, K. ; Hayakawa, M. ; Aso, K.
Author_Institution :
Sony Res. Center, Yokohama, Japan
fDate :
11/1/1991 12:00:00 AM
Abstract :
Experimental results on the magnetic properties and structure in Co-based nitride thin films are presented. The high-temperature stability of magnetic softness in Co-based nitride films is shown to originate from crystalline structure with very small dimension, confirmed by small-angle X-ray diffraction and Mossbauer spectroscopy, though only halos are observed in a normal X-ray diffraction experiment. By structure transformation from amorphous to small crystallite magnetostriction changes rapidly and magnetic moment increases. These structures influence magnetic anisotropy induced by field cooling. The anisotropy cannot be controlled below 500°C in the CoZrN films, though by addition of Fe the anisotropy can be controlled up to 350°C. It is suggested that this anisotropy originates from hexagonal-close-packed-like atomic stacking order in the FCC Co crystallite
Keywords :
Mossbauer effect; X-ray diffraction examination of materials; cobalt compounds; crystallisation; ferromagnetic properties of substances; magnetic anisotropy; magnetic heads; magnetic moments; magnetic properties of amorphous substances; magnetic thin films; magnetostriction; noncrystalline state structure; sputtered coatings; Co-based nitride thin films; CoFeZrN; CoZrN; Mossbauer spectroscopy; amorphous thin films; amorphous-small crystallite transformation; atomic stacking order; field cooling; hexagonal-close-packed-like; high-temperature stability; magnetic anisotropy; magnetic moment; magnetic properties; magnetic recording heads; magnetic softness; magnetostriction; small-angle X-ray diffraction; sputtered films; structure; Amorphous magnetic materials; Anisotropic magnetoresistance; Crystallization; Magnetic anisotropy; Magnetic films; Magnetic properties; Magnetostriction; Perpendicular magnetic anisotropy; Stability; X-ray diffraction;
Journal_Title :
Magnetics, IEEE Transactions on