Reflection phase of electromagnetic bandgap structure measurement based on parallel-plate waveguide system

A carefully designed parallel-plate waveguide measurement system is constructed to measure the reflection phase of a compact electromagnetic bandgap (EBG) structure. A quasi-plane wave is created in the parallel-plate waveguide chamber, which is the basic condition of phase measurement. Two EBG samples with different parameters are measured in this system. The data of the two samples agree well with those of infinite array EBG mode simulations, which proves that this measurement method has good accuracy and reliability. This system reduces the cost of EBG reflection phase measurement and the samples used in the experiment have a much smaller size.