Title :
WA-A6 Determination of intrinsic noise contributions in surface-channel CCD´s
Author :
Devenyi, T.F. ; Kriegler, R.J.
fDate :
11/1/1978 12:00:00 AM
Keywords :
Capacitance; Clocks; Dark current; Electrodes; Frequency measurement; Indium phosphide; Low-frequency noise; Noise generators; Noise measurement; Semiconductor device noise;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1978.19331
