Title :
WA-A7 correlation between capacitance deep level measurements and low-frequency noise in InP Schottky diodes
Author :
White, Amanda M. ; Grant, Alex J. ; Day, B.
fDate :
11/1/1978 12:00:00 AM
Keywords :
Capacitance; Charge carrier processes; Costs; Indium phosphide; Level measurement; Low-frequency noise; Optical noise; Photovoltaic cells; Schottky diodes; Semiconductor device noise;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1978.19333
