Title :
WA-B6 GaAs Schottky-barrier gate CCD
Author :
Deyhimy, I. ; Harris, James S. ; Edwall, D.D. ; Eden, R.C.
fDate :
11/1/1978 12:00:00 AM
Keywords :
Charge coupled devices; Charge measurement; Charge transfer; Current measurement; Electron mobility; Gallium arsenide; Infrared imaging; Insulation; Substrates; Testing;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/T-ED.1978.19338