DocumentCode :
1062522
Title :
From the EIC
Author :
Cheng, Tim
Volume :
25
Issue :
1
fYear :
2008
Firstpage :
4
Lastpage :
4
Abstract :
The design of next-generation RFICs remains challenging and demands innovation. In addition, with signal frequencies reaching tens of GHz, testing these circuits has created extraordinary challenges. This issue of D&T features a special issue on design and test of RFICs. This issue also includes an in-depth interview with Chris Rowen—founder, president, and CEO of Tensilica. In addition, there are four general-interest articles addressing diverse design and test issues.
Keywords :
Chris Rowen; NoC; RFIC; hybrid approach; runtime power monitoring; simultaneous switching noise;
fLanguage :
English
Journal_Title :
Design & Test of Computers, IEEE
Publisher :
ieee
ISSN :
0740-7475
Type :
jour
DOI :
10.1109/MDT.2008.11
Filename :
4447900
Link To Document :
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