Title :
Time-Division-Multiplexed Test Delivery for NoC Systems
Author :
Nolen, John Mark ; Mahapatra, Rabi N.
Author_Institution :
Texas A&M Univ., College Station
Abstract :
This test-scheduling approach for NoC designs minimizes test time through high-speed test delivery over the network, with test data interleaved via time-division multiplexing (TDM), and through slower test execution at the target cores. Results with a test-scheduling algorithm and a simulated test case from ITC 2002 SoC benchmarks show significant test time and I/O savings compared to a single-clock approach.
Keywords :
logic design; logic testing; network-on-chip; scheduling; time division multiplexing; I/O saving; ITC 2002 SoC benchmark; NoC system design; single-clock approach; test-scheduling approach; time-division-multiplexed test delivery; Bandwidth; Circuit testing; Design engineering; Large-scale systems; Network-on-a-chip; Parallel processing; Reliability engineering; Semiconductor device testing; System testing; Time to market; NoC; SoC; TAM; TDM; embedded-core testing; scan test delivery; test access mechanism; time-division multiplexing;
Journal_Title :
Design & Test of Computers, IEEE
DOI :
10.1109/MDT.2008.27
